UOE/2018/001/RW - Ellipsometer

This ERC-funded project led by Prof. Bill Barnes concerns the interaction of light with nanostructured materials. A key part of the project is to measure the optical properties of a range of materials, primarily in the form of thin films on glass or semiconducting substrates. Substrates will typically be 1 mm thick, and approx. 10 – 25 mm square, although other sizes may be used. Film thicknesses will be typically in the range 5 nm – 5 microns. The films to be investigated range from reflective metals such as gold and silver, through dye-doped polymers, to graphene-like materials. In order to undertake this piece of research the University is procuring an Ellipsometer with supporting maintenance and training.

Supplies

19/04/2018 12:00:00

38510000-3  Microscopes
38000000-5  Laboratory, optical and precision equipments (excl. glasses)