NNLC590 - Analytical Equipment for JEOL ARM 200cF

NNL operates the country’s only electron optics capability equipped for the analysis of irradiated fuel and structural components. This Procurement Specification covers the replacement of analytical equipment installed on the JEOL ARM 200CF transmission electron microscope (TEM) in NNL’s Central Laboratory. The equipment required is an electron energy-loss analysis system, an imaging camera and a system that integrates the data capture with the microscope to produce spatially correlated datasets.

20/12/2024 17:00:00

38000000-5  Laboratory, optical and precision equipments (excl. glasses)
38519500-1  Laboratory microscope replacement bulbs
38510000-3  Microscopes
38511000-0  Electron microscopes
38511100-1  Scanning electron microscopes
38511200-2  Transmission electron microscope
38512000-7  Ion and molecular microscopes
38512100-8  Ion microscopes